Transmission Electron Microscopy of Semiconductor Nanostructures An Analysis of Composition and Strain State /

• Κύριος συγγραφέας: Rosenauer, Andreas (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2003.
• Έκδοση: 1st ed. 2003.
• Σειρά: Springer Tracts in Modern Physics, 182
• Θέματα: Condensed matter.; Solid state physics.; Spectroscopy.; Microscopy.; Physical measurements.; Measurement .; Materials science.; Condensed Matter Physics.; Solid State Physics.; Spectroscopy and Microscopy.; Measurement Science and Instrumentation.; Characterization and Evaluation of Materials.

This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods i...

Πίνακας περιεχομένων:

• Theoretical Fundamentals of Transmission Electron Microscopy
• Electron Diffraction
• Image Formation
• Digital Image Analysis
• Strain State Analysis
• Lattice Fringe Analysis
• Applications
• In0.6Ga0.4As/GaAs(001) SK Layers
• InAs Quantum Dots
• Electron Holography: AlAs/GaAs Superlattices
• Outlook.