Transmission Electron Microscopy of Semiconductor Nanostructures An Analysis of Composition and Strain State /
This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods i...
Κύριος συγγραφέας: | |
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Συγγραφή απο Οργανισμό/Αρχή: | |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2003.
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Έκδοση: | 1st ed. 2003. |
Σειρά: | Springer Tracts in Modern Physics,
182 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Theoretical Fundamentals of Transmission Electron Microscopy
- Electron Diffraction
- Image Formation
- Digital Image Analysis
- Strain State Analysis
- Lattice Fringe Analysis
- Applications
- In0.6Ga0.4As/GaAs(001) SK Layers
- InAs Quantum Dots
- Electron Holography: AlAs/GaAs Superlattices
- Outlook.