Handbook of Practical X-Ray Fluorescence Analysis

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Beckhoff, Burkhard (Επιμελητής έκδοσης), Kanngießer, habil. Birgit (Επιμελητής έκδοσης), Langhoff, Norbert (Επιμελητής έκδοσης), Wedell, Reiner (Επιμελητής έκδοσης), Wolff, Helmut (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
• Θέματα: Chemistry.; Analytical chemistry.; Mass spectrometry.; Condensed matter.; Solid state physics.; Spectroscopy.; Microscopy.; Materials science.; Analytical Chemistry.; Mass Spectrometry.; Characterization and Evaluation of Materials.; Solid State Physics.; Spectroscopy and Microscopy.; Condensed Matter Physics.

X-Ray Fluorescence analysis (XRF) is a reliable multi-elemental and nondestructive analytical method widely used in research and industrial applications. This practical handbook provides self-contained modules featuring XRF instrumentation, quantification methods, and most of the current application...

Πίνακας περιεχομένων:

• X-ray tubes
• Radioisotopes
• Synchrotron radiation source
• Mirror optics
• Diffraction optics
• Optics for monochromators
• Focusing diffraction optics
• Refraction X-ray optics
• X-ray detectors and signal processing
• High resolution imaging X-ray CCD spectrometers
• Wavelength dispersive XRF and a comparison with EDS
• Quantitative analysis
• Specimen preparation
• Micro-X-ray fluorescence spectroscopy
• Micro XRF with synchrotron radiation
• TXRF wafer analysis
• Analysis of layers
• Environmental studies
• Geology, mining, metallurgy
• Arts and archaeology
• XRF-application in numismatics
• Analysis for forensic investigations
• X-Ray fluorescence analysis in the life sciences
• Non-invasive identification of chemical compounds by EDXRS
• X-ray safety and protection
• Useful data sources and links.