SpringerLink (Online service), Yeung, D., Kwok, J. T., Fred, A., Roli, F., & Ridder, D. d. (2006). Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings. Springer Berlin Heidelberg.
Chicago Style (17th ed.) CitationSpringerLink (Online service), Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, and Dick de Ridder. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings. Berlin, Heidelberg: Springer Berlin Heidelberg, 2006.
MLA (8th ed.) CitationSpringerLink (Online service), et al. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings. Springer Berlin Heidelberg, 2006.