Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Yeung, Dit-Yan (Editor), Kwok, James T. (Editor), Fred, Ana (Editor), Roli, Fabio (Editor), Ridder, Dick de (Editor)
Format: Electronic eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
Series:Lecture Notes in Computer Science, 4109
Subjects:
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