Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Bhushan, Bharat (Editor), Kawata, Satoshi (Editor), Fuchs, Harald (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007.
• Series: NanoScience and Technology,
• Subjects: Engineering.; Polymers.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspect...

Table of Contents:

• Integrated Cantilevers and Atomic Force Microscopes
• Electrostatic Microscanner
• Low-Noise Methods for Optical Measurements of Cantilever Deflections
• Q-controlled Dynamic Force Microscopy in Air and Liquids
• High-Frequency Dynamic Force Microscopy
• Torsional Resonance Microscopy and Its Applications
• Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy
• Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale
• New AFM Developments to Study Elasticity and Adhesion at the Nanoscale
• Near-Field Raman Spectroscopy and Imaging.