Applied Scanning Probe Methods VI Characterization /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Bhushan, Bharat (Επιμελητής έκδοσης), Kawata, Satoshi (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007.
• Σειρά: NanoScience and Technology,
• Θέματα: Engineering.; Physical chemistry.; Polymers.; Solid state physics.; Nanotechnology.; Materials > Surfaces.; Thin films.; Nanotechnology and Microengineering.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.; Physical Chemistry.; Solid State Physics.

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspect...

Πίνακας περιεχομένων:

• Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices
• Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules
• STM Studies on Molecular Assembly at Solid/Liquid Interfaces
• Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope
• Atomic Force Microscopy of DNA Structure and Interactions
• Direct Detection of Ligand-Protein Interaction Using AFM
• Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments
• Noncontact Atomic Force Microscopy
• Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations
• Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy.