Applied Scanning Probe Methods VI Characterization /

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspect...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Bhushan, Bharat (Editor), Kawata, Satoshi (Editor)
Format: Electronic eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007.
Series:NanoScience and Technology,
Subjects:
Online Access:Full Text via HEAL-Link
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by Bhushan, Bharat 1949-
Published 2007
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