Scanning Electron Microscopy Physics of Image Formation and Microanalysis /

• Κύριος συγγραφέας: Reimer, Ludwig (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1998.
• Έκδοση: 2nd ed. 1998.
• Σειρά: Springer Series in Optical Sciences, 45
• Θέματα: Spectroscopy.; Microscopy.; Solid state physics.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Physics.; Spectroscopy and Microscopy.; Solid State Physics.; Surface and Interface Science, Thin Films.; Physics, general.

 Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. 

 Electron Optics of a Scanning Electron Microscope -- Electron Scattering and Diffusion -- Emission of Backscattered and Secondary Electrons -- Electron Detectors and Spectrometers -- Image Contrast and Signal Processing -- Electron-Beam-Induced Current and Cathodoluminescence -- Special Techniques in SEM -- Crystal Structure Analysis by Diffraction -- Elemental Analysis and Imaging with X-Rays.