X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

• Κύριος συγγραφέας: Schmidbauer, Martin (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2004.
• Έκδοση: 1st ed. 2004.
• Σειρά: Springer Tracts in Modern Physics, 199
• Θέματα: Optics.; Electrodynamics.; Atoms.; Physics.; Optical materials.; Electronic materials.; Condensed matter.; Classical Electrodynamics.; Atomic, Molecular, Optical and Plasma Physics.; Optical and Electronic Materials.; Condensed Matter Physics.

 This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. 

 A Brief Introduction to the Topic -- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures -- Experimental Optimization -- A Model System: LPE SiGe/Si(001) Islands -- Dynamical Scattering at Grazing Incidence -- Characterization of Quantum Dots -- Characterization of Interface Roughness -- Appendix.