X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevanc...
Κύριος συγγραφέας: | Schmidbauer, Martin (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2004.
|
Έκδοση: | 1st ed. 2004. |
Σειρά: | Springer Tracts in Modern Physics,
199 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
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