Three-Dimensional X-Ray Diffraction Microscopy Mapping Polycrystals and their Dynamics /

• Κύριος συγγραφέας: Poulsen, Henning Friis (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2004.
• Έκδοση: 1st ed. 2004.
• Σειρά: Springer Tracts in Modern Physics, 205
• Θέματα: Condensed matter.; Crystallography.; Condensed Matter Physics.; Crystallography and Scattering Methods.

 Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science. 

 Introduction -- Methods for Meso-scale Structural Characterization -- Geometric Principles -- GRAINDEX and Related Analysis -- Orientation Mapping -- Combining 3DXRD and Absorption Contrast Tomography -- Multi-grain Crystallography -- The 3DXRD Microscope -- Applications -- Alternative Approaches -- Concluding Remarks.