Advances in Pattern Recognition Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Ferri, Francesc J. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Inesta, Jose M. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Amin, Adnan (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Pudil, Pavel (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2000.
• Έκδοση: 1st ed. 2000.
• Σειρά: Lecture Notes in Computer Science, 1876
• Θέματα: Pattern recognition.; Optical data processing.; Application software.; Computer graphics.; Artificial intelligence.; Pattern Recognition.; Image Processing and Computer Vision.; Computer Applications.; Computer Graphics.; Artificial Intelligence.

 This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection. 

 Invited Papers -- Pierre Devijver Lecture -- Hybrid and Combined Methods -- Applications -- Document Image Analysis -- Grammar and Language Methods -- Structural Matching -- Graph-Based Methods -- Shape Analysis -- SSPR Poster Session -- Clustering and Density Estimation -- Object Recognition -- General Methodology I -- General Methodology II -- Feature Extraction and Selection -- SPR Poster Session.