Advances in Pattern Recognition Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Ferri, Francesc J. (Editor, http://id.loc.gov/vocabulary/relators/edt), Inesta, Jose M. (Editor, http://id.loc.gov/vocabulary/relators/edt), Amin, Adnan (Editor, http://id.loc.gov/vocabulary/relators/edt), Pudil, Pavel (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2000.
• Edition: 1st ed. 2000.
• Series: Lecture Notes in Computer Science, 1876
• Subjects: Pattern recognition.; Optical data processing.; Application software.; Computer graphics.; Artificial intelligence.; Pattern Recognition.; Image Processing and Computer Vision.; Computer Applications.; Computer Graphics.; Artificial Intelligence.

This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52...

Table of Contents:

• Invited Papers
• Pierre Devijver Lecture
• Hybrid and Combined Methods
• Applications
• Document Image Analysis
• Grammar and Language Methods
• Structural Matching
• Graph-Based Methods
• Shape Analysis
• SSPR Poster Session
• Clustering and Density Estimation
• Object Recognition
• General Methodology I
• General Methodology II
• Feature Extraction and Selection
• SPR Poster Session.