Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons /

• Κύριος συγγραφέας: Schubert, Mathias (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
• Σειρά: Springer Tracts in Modern Physics, 209
• Θέματα: Physics.; Optics.; Electrodynamics.; Optoelectronics.; Plasmons (Physics).; Engineering.; Optical materials.; Electronic materials.; Materials > Surfaces.; Thin films.; Optics and Electrodynamics.; Surfaces and Interfaces, Thin Films.; Optical and Electronic Materials.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Engineering, general.

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It desc...