Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons /

• Main Author: Schubert, Mathias (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
• Series: Springer Tracts in Modern Physics, 209
• Subjects: Physics.; Optics.; Electrodynamics.; Optoelectronics.; Plasmons (Physics).; Engineering.; Optical materials.; Electronic materials.; Materials > Surfaces.; Thin films.; Optics and Electrodynamics.; Surfaces and Interfaces, Thin Films.; Optical and Electronic Materials.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Engineering, general.

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It desc...

Table of Contents:

• Introduction
• Ellipsometry
• Infrared Model Dielectric Functions
• Polaritons in Semiconductor Layer Structures
• Anisotropic Substrates
• Zinsblende-Structure Materials (III-V)
• Wurtzite-Structure Materials (Group-III Nitrides, ZnO)
• Magneto-optic Ellipsometry.