Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons /
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It desc...
Κύριος συγγραφέας: | |
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Συγγραφή απο Οργανισμό/Αρχή: | |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg,
2005.
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Σειρά: | Springer Tracts in Modern Physics,
209 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Introduction
- Ellipsometry
- Infrared Model Dielectric Functions
- Polaritons in Semiconductor Layer Structures
- Anisotropic Substrates
- Zinsblende-Structure Materials (III-V)
- Wurtzite-Structure Materials (Group-III Nitrides, ZnO)
- Magneto-optic Ellipsometry.