Applied RHEED Reflection High-Energy Electron Diffraction During Crystal Growth /

• Κύριος συγγραφέας: Braun, Wolfgang (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1999.
• Έκδοση: 1st ed. 1999.
• Σειρά: Springer Tracts in Modern Physics, 154
• Θέματα: Condensed matter.; Physical measurements.; Measurement .; Condensed Matter Physics.; Measurement Science and Instrumentation.
• Φυσική περιγραφή: IX, 220 p. 180 illus., 11 illus. in color. online resource.
• ISBN: 9783540494850
• ISSN: 0081-3869 ;
• DOI: 10.1007/BFb0109548

The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.