Applied RHEED Reflection High-Energy Electron Diffraction During Crystal Growth /

The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segr...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Braun, Wolfgang (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1999.
Έκδοση:1st ed. 1999.
Σειρά:Springer Tracts in Modern Physics, 154
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
LEADER 02770nam a2200505 4500
001 978-3-540-49485-0
003 DE-He213
005 20191029061026.0
007 cr nn 008mamaa
008 121227s1999 gw | s |||| 0|eng d
020 |a 9783540494850  |9 978-3-540-49485-0 
024 7 |a 10.1007/BFb0109548  |2 doi 
040 |d GrThAP 
050 4 |a QC173.45-173.458 
072 7 |a PHF  |2 bicssc 
072 7 |a SCI077000  |2 bisacsh 
072 7 |a PHF  |2 thema 
082 0 4 |a 530.41  |2 23 
100 1 |a Braun, Wolfgang.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a Applied RHEED  |h [electronic resource] :  |b Reflection High-Energy Electron Diffraction During Crystal Growth /  |c by Wolfgang Braun. 
250 |a 1st ed. 1999. 
264 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg :  |b Imprint: Springer,  |c 1999. 
300 |a IX, 220 p. 180 illus., 11 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a Springer Tracts in Modern Physics,  |x 0081-3869 ;  |v 154 
505 0 |a MBE-grown semiconductor interfaces -- Reflection high-energy electron diffraction (RHEED) -- RHEED oscillations -- Semikinematical simulations of RHEED patterns -- Kikuchi lines -- RHEED with rotating substrates -- Reconstruction-induced phase shifts of RHEED oscillations -- Energy loss spectroscopy during growth -- Phase shifts: Models -- Applications of reconstruction-induced phase shifts -- Closing remarks. 
520 |a The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates. 
650 0 |a Condensed matter. 
650 0 |a Physical measurements. 
650 0 |a Measurement   . 
650 1 4 |a Condensed Matter Physics.  |0 http://scigraph.springernature.com/things/product-market-codes/P25005 
650 2 4 |a Measurement Science and Instrumentation.  |0 http://scigraph.springernature.com/things/product-market-codes/P31040 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9783662156148 
776 0 8 |i Printed edition:  |z 9783662156131 
776 0 8 |i Printed edition:  |z 9783540651994 
830 0 |a Springer Tracts in Modern Physics,  |x 0081-3869 ;  |v 154 
856 4 0 |u https://doi.org/10.1007/BFb0109548  |z Full Text via HEAL-Link 
912 |a ZDB-2-PHA 
912 |a ZDB-2-BAE 
950 |a Physics and Astronomy (Springer-11651)