Applied RHEED Reflection High-Energy Electron Diffraction During Crystal Growth /

The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segr...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Braun, Wolfgang (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1999.
Έκδοση:1st ed. 1999.
Σειρά:Springer Tracts in Modern Physics, 154
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • MBE-grown semiconductor interfaces
  • Reflection high-energy electron diffraction (RHEED)
  • RHEED oscillations
  • Semikinematical simulations of RHEED patterns
  • Kikuchi lines
  • RHEED with rotating substrates
  • Reconstruction-induced phase shifts of RHEED oscillations
  • Energy loss spectroscopy during growth
  • Phase shifts: Models
  • Applications of reconstruction-induced phase shifts
  • Closing remarks.