X-Ray Scattering from Soft-Matter Thin Films Materials Science and Basic Research /

• Κύριος συγγραφέας: Tolan, Metin (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1999.
• Έκδοση: 1st ed. 1999.
• Σειρά: Springer Tracts in Modern Physics, 148
• Θέματα: Materials-Surfaces.; Thin films.; Amorphous substances.; Complex fluids.; Solid state physics.; Spectroscopy.; Microscopy.; Surfaces and Interfaces, Thin Films.; Soft and Granular Matter, Complex Fluids and Microfluidics.; Solid State Physics.; Spectroscopy and Microscopy.

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as t...

Πίνακας περιεχομένων:

• Reflectivity of x-rays from surfaces
• Reflectivity experiments
• Advanced analysis techniques
• Statistical description of interfaces
• Off-specular scattering
• X-ray scattering with coherent radiation
• Closing remarks.