High-Resolution X-Ray Scattering from Thin Films and Multilayers

• Κύριοι συγγραφείς: Holy, Vaclav (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Pietsch, Ullrich (http://id.loc.gov/vocabulary/relators/aut), Baumbach, Tilo (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1999.
• Έκδοση: 1st ed. 1999.
• Σειρά: Springer Tracts in Modern Physics, 149
• Θέματα: Lasers.; Photonics.; Materials-Surfaces.; Thin films.; Crystallography.; Optics, Lasers, Photonics, Optical Devices.; Surfaces and Interfaces, Thin Films.; Crystallography and Scattering Methods.

 This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. 

 Basic elements of the equipment -- Diffractometers and reflectometers -- Scans and resolution in angular and reciprocal space -- Basic principles -- Kinematical scattering theory -- Dynamical scattering theory -- Layer thicknesses of single layers and multilayers -- Lattice parameters and lattice strains in single expitaxial layers -- Volume defects in layers -- X-ray reflection by rough multilayers -- X-ray scattering by gratings and dots -- A. Wave vectors and amplitudes of the internal wavefields in a dynamically scattering crystal.