High-Resolution X-Ray Scattering from Thin Films and Multilayers
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dy...
Κύριοι συγγραφείς: | Holy, Vaclav (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Pietsch, Ullrich (http://id.loc.gov/vocabulary/relators/aut), Baumbach, Tilo (http://id.loc.gov/vocabulary/relators/aut) |
---|---|
Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
1999.
|
Έκδοση: | 1st ed. 1999. |
Σειρά: | Springer Tracts in Modern Physics,
149 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
-
Electronic Defect States in Alkali Halides Effects of Interaction with Molecular Ions /
ανά: Dierolf, Volkmar, κ.ά.
Έκδοση: (2003) -
Optical Properties of Photonic Crystals
ανά: Sakoda, Kazuaki, κ.ά.
Έκδοση: (2001) -
Optical Nanotechnologies The Manipulation of Surface and Local Plasmons /
Έκδοση: (2003) -
Surface Plasmon Resonance Sensors A Materials Guide to Design, Characterization, Optimization, and Usage /
ανά: Oliveira, Leiva Casemiro, κ.ά.
Έκδοση: (2019) -
New Directions in Thin Film Nanophotonics
ανά: K. V., Sreekanth, κ.ά.
Έκδοση: (2019)