High-Resolution X-Ray Scattering from Thin Films and Multilayers

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dy...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Holy, Vaclav (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Pietsch, Ullrich (http://id.loc.gov/vocabulary/relators/aut), Baumbach, Tilo (http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1999.
Έκδοση:1st ed. 1999.
Σειρά:Springer Tracts in Modern Physics, 149
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Basic elements of the equipment
  • Diffractometers and reflectometers
  • Scans and resolution in angular and reciprocal space
  • Basic principles
  • Kinematical scattering theory
  • Dynamical scattering theory
  • Layer thicknesses of single layers and multilayers
  • Lattice parameters and lattice strains in single expitaxial layers
  • Volume defects in layers
  • X-ray reflection by rough multilayers
  • X-ray scattering by gratings and dots
  • A. Wave vectors and amplitudes of the internal wavefields in a dynamically scattering crystal.