Transmission Electron Microscopy and Diffractometry of Materials

• Κύριοι συγγραφείς: Fultz, Brent (Συγγραφέας), Howe, James M. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008.
• Έκδοση: Third Edition.
• Θέματα: Materials science.; Solid state physics.; Crystallography.; Spectroscopy.; Microscopy.; Engineering.; Materials > Surfaces.; Thin films.; Materials Science.; Characterization and Evaluation of Materials.; Surfaces and Interfaces, Thin Films.; Solid State Physics.; Spectroscopy and Microscopy.; Engineering, general.

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...

Πίνακας περιεχομένων:

• Diffraction and the X-Ray Powder Diffractometer
• The TEM and its Optics
• Scattering
• Inelastic Electron Scattering and Spectroscopy
• Diffraction from Crystals
• Electron Diffraction and Crystallography
• Diffraction Contrast in TEM Images
• Diffraction Lineshapes
• Patterson Functions and Diffuse Scattering
• High-Resolution TEM Imaging
• High-Resolution STEM Imaging
• Dynamical Theory.