Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy /

• Κύριοι συγγραφείς: Khulbe, K. C. (Συγγραφέας), Feng, C. Y. (Συγγραφέας), Matsuura, Takeshi (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008.
• Σειρά: Springer Laboratory
• Θέματα: Chemistry.; Science.; Analytical chemistry.; Food > Biotechnology.; Polymers.; Chemical engineering.; Polymer Sciences.; Science, general.; Industrial Chemistry/Chemical Engineering.; Biomedicine general.; Analytical Chemistry.; Food Science.

Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on...

Πίνακας περιεχομένων:

• Synthetic Membranes for Membrane Processes
• Atomic Force Microscopy
• Nodular Structure of Polymers in the Membrane
• Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface
• Cross-sectional AFM Image
• Adhesion
• Membrane Surface Morphology and Membrane Performance.