Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Bhushan, Bharat (Επιμελητής έκδοσης), Fuchs, Harald (Επιμελητής έκδοσης), Tomitori, Masahiko (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
• Σειρά: Nano Science and Technolgy,
• Θέματα: Engineering.; Polymers.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...

Πίνακας περιεχομένων:

• Background-Free Apertureless Near-Field Optical Imaging
• Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes
• Near Field Probes: From Optical Fibers to Optical Nanoantennas
• Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging
• Scanning Probes for the Life Sciences
• Self-Sensing Cantilever Sensor for Bioscience
• AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication
• Cantilever Spring-Constant Calibration in Atomic Force Microscopy
• Frequency Modulation Atomic Force Microscopy in Liquids
• Kelvin Probe Force Microscopy: Recent Advances and Applications
• Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale
• Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy.