Modern Developments in X-Ray and Neutron Optics

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Erko, Alexei (Επιμελητής έκδοσης), Idir, Mourad (Επιμελητής έκδοσης), Krist, Thomas (Επιμελητής έκδοσης), Michette, Alan G. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008.
• Σειρά: Springer Series in optical science, 137
• Θέματα: Physics.; Physical measurements.; Measurement.; Optics.; Optoelectronics.; Plasmons (Physics).; Engineering.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Measurement Science and Instrumentation.; Engineering, general.

 This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation as well as recent theoretical approaches to modelling and ray-tracing the X-ray and neutron optical systems. It is based on the joint research activities of specialists in X-ray and neutron optics from 11 countries, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002--2006. The chapters are written by leading specialists from European laboratories, universities and large facilities. In addition to new ideas and concepts, the contents provide a large amount of practical information about recently implemented devices and methods. 

 Theoretical Approaches and Calculations -- X-Ray and Neutron Optical Systems -- The BESSY Raytrace Program RAY -- Neutron Beam Phase Space Mapping -- Raytrace of Neutron Optical Systems with RESTRAX -- Wavefront Propagation -- Theoretical Analysis of X-Ray Waveguides -- Focusing Optics for Neutrons -- Volume Effects in Zone Plates -- Nano-Optics Metrology -- Slope Error and Surface Roughness -- The Long Trace Profilers -- The Nanometer Optical Component Measuring Machine -- Shape Optimization of High Performance X-Ray Optics -- Measurement of Groove Density of Diffraction Gratings -- The COST P7 Round Robin for Slope Measuring Profilers -- Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology -- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data -- Refection/Refraction Optics -- Hard X-Ray Microoptics -- Capillary Optics for X-Rays -- Reflective Optical Arrays -- Reflective Optical Structures and Imaging Detector Systems -- CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays -- Multilayer Optics Developments -- Neutron Supermirror Development -- Stress Reduction in Multilayers Used for X-Ray and Neutron Optics -- Multilayers with Ultra-Short Periods -- Specially Designed Multilayers -- Diffraction Optics -- Diffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces -- Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering -- Volume Modulated Diffraction X-Ray Optics -- High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors -- Thermal Effects under Synchrotron Radiation Power Absorption.