Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques /

• Κύριοι συγγραφείς: Bhushan, Bharat (Συγγραφέας), Fuchs, Harald (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Σειρά: NanoScience and Technology,
• Θέματα: Engineering.; Polymers.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.

Πίνακας περιεχομένων:

• Oscillation Control in Dynamic SPM with Quartz Sensors
• Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation
• Mechanical Diode-Based Ultrasonic Atomic Force Microscopies
• Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science
• Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements
• AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip
• Local Mechanical Properties by Atomic Force Microscopy Nanoindentations
• Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.