Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques /

• Main Authors: Bhushan, Bharat (Author), Fuchs, Harald (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Series: NanoScience and Technology,
• Subjects: Engineering.; Polymers.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.

Table of Contents:

• Oscillation Control in Dynamic SPM with Quartz Sensors
• Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation
• Mechanical Diode-Based Ultrasonic Atomic Force Microscopies
• Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science
• Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements
• AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip
• Local Mechanical Properties by Atomic Force Microscopy Nanoindentations
• Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.