EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 1: Instrumentation and Methods /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Luysberg, Martina (Επιμελητής έκδοσης), Tillmann, Karsten (Επιμελητής έκδοσης), Weirich, Thomas (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008.
• Θέματα: Physics.; Physics, general.

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the c...

Πίνακας περιεχομένων:

• Instrumentation and Methods
• TEM and STEM instrumentation and Electron Optics
• TEM and STEM methods
• SEM/FIB Instrumentation and Methods
• Other Microscopies
• Image analysis and Processing
• Sample Preparation for Materials Science and Biology.