Hardware and Software: Verification and Testing 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008. Proceedings /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Chockler, Hana (Επιμελητής έκδοσης), Hu, Alan J. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
• Σειρά: Lecture Notes in Computer Science, 5394
• Θέματα: Computer science.; Software engineering.; Programming languages (Electronic computers).; Computer logic.; Computer Science.; Software Engineering.; Logics and Meanings of Programs.; Programming Languages, Compilers, Interpreters.

This book constitutes the thoroughly refereed post-conference proceedings of the 4th International Haifa Verification Conference, HVC 2008, held in Haifa, Israel in October 2008. The 12 revised full papers and 4 tool papers presented together with 6 invited lectures were carefully reviewed and selec...

Πίνακας περιεχομένων:

• Section 1: Invited Talks
• Hazards of Verification
• Automata-Theoretic Model Checking Revisited
• Proofs, Interpolants, and Relevance Heuristics
• Is Verification Getting Too Complex?
• Can Mutation Analysis Help Fix Our Broken Coverage Metrics?
• Practical Considerations Concerning HL-to -RT Equivalence Checking
• Section 2: Regular Papers
• A Framework for Inherent Vacuity
• A Meta Heuristic for Effectively Detecting Concurrency Errors
• A Uniform Approach to Three-Valued Semantics for ?-Calculus on Abstractions of Hybrid Automata
• Automatic Boosting of Cross-Product Coverage Using Bayesian Networks
• Efficient Decision Procedure for Bounded Integer Non-linear Operations Using SMT( )
• Evaluating Workloads Using Comparative Functional Coverage
• Iterative Delta Debugging
• Linear-Time Reductions of Resolution Proofs
• Significant Diagnostic Counterexamples in Probabilistic Model Checking
• Statistical Model Checking of Mixed-Analog Circuits with an Application to a Third Order ????? Modulator
• Structural Contradictions
• Synthesizing Test Models from Test Cases
• Section 3: Tool Papers
• d-TSR: Parallelizing SMT-Based BMC Using Tunnels over a Distributed Framework
• Progress in Automated Software Defect Prediction
• SeeCode – A Code Review Plug-in for Eclipse
• User-Friendly Model Checking: Automatically Configuring Algorithms with RuleBase/PE.