Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

• Κύριοι συγγραφείς: Breitenstein, Otwin (Συγγραφέας), Warta, Wilhelm (Συγγραφέας), Langenkamp, Martin (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
• Σειρά: Springer Series in Advanced Microelectronics, 10
• Θέματα: Physics.; Optics.; Optoelectronics.; Plasmons (Physics).; Engineering.; Structural materials.; Materials science.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Characterization and Evaluation of Materials.; Engineering, general.; Structural Materials.

 This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced. 

 Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.