Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

• Main Authors: Breitenstein, Otwin (Author), Warta, Wilhelm (Author), Langenkamp, Martin (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
• Series: Springer Series in Advanced Microelectronics, 10
• Subjects: Physics.; Optics.; Optoelectronics.; Plasmons (Physics).; Engineering.; Structural materials.; Materials science.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Characterization and Evaluation of Materials.; Engineering, general.; Structural Materials.

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to el...