Electro-Optical Effects to Visualize Field and Current Distributions in Semiconductors

The book describes the basic principles that relate to field and current inhomogeneities in semiconductors and their kinetics that occur in the regime of negative differential conductances of semiconductors. The book presents the related theory and experiment. It proceeds to give for the first time...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Böer, Karl W. (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
Σειρά:Springer Series in Solid-State Sciences, 162
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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100 1 |a Böer, Karl W.  |e author. 
245 1 0 |a Electro-Optical Effects to Visualize Field and Current Distributions in Semiconductors  |h [electronic resource] /  |c by Karl W. Böer. 
264 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg,  |c 2010. 
300 |a VIII, 125 p.  |b online resource. 
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490 1 |a Springer Series in Solid-State Sciences,  |x 0171-1873 ;  |v 162 
505 0 |a High-Field Domains -- Moving High-Field Domains -- Negative Differential Conductivity Caused by Mobility -- Negative Differential Conductivity in Other Materials -- Current Channels. 
520 |a The book describes the basic principles that relate to field and current inhomogeneities in semiconductors and their kinetics that occur in the regime of negative differential conductances of semiconductors. The book presents the related theory and experiment. It proceeds to give for the first time the experimental methods to observe directly these inhomogeneities within the semiconductor. It analyses in detail the different ranges in which such inhomogeneities occur, when they are stationary and when not and what technical and device application result. The accompanying film on the website demonstrates all related kinetic effects. Information on these effects was previously mostly available indirectly by interpretation of current-voltage characteristics, or by point contact probing along the surface, or by changes in the luminescence spectrum. The material is based on the original papers of the research team of the author, starting in the late 50’s and updated to incl. 2008. 
650 0 |a Physics. 
650 0 |a Solid state physics. 
650 0 |a Spectroscopy. 
650 0 |a Microscopy. 
650 0 |a Microwaves. 
650 0 |a Optical engineering. 
650 0 |a Optical materials. 
650 0 |a Electronic materials. 
650 1 4 |a Physics. 
650 2 4 |a Solid State Physics. 
650 2 4 |a Spectroscopy and Microscopy. 
650 2 4 |a Optical and Electronic Materials. 
650 2 4 |a Microwaves, RF and Optical Engineering. 
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776 0 8 |i Printed edition:  |z 9783642034398 
830 0 |a Springer Series in Solid-State Sciences,  |x 0171-1873 ;  |v 162 
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950 |a Physics and Astronomy (Springer-11651)