X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /

• Κύριοι συγγραφείς: Waseda, Yoshio (Συγγραφέας), Matsubara, Eiichiro (Συγγραφέας), Shinoda, Kozo (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011.
• Θέματα: Materials science.; Solid state physics.; Crystallography.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Nanotechnology and Microengineering.; Solid State Physics.; Spectroscopy and Microscopy.

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of...

Πίνακας περιεχομένων:

• Fundamental Properties of X-rays
• Geometry of Crystals
• Scattering and Diffraction by Atoms and Crystals
• Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures
• Reciprocal Lattice and Integrated Intensity from Crystals
• Symmetry Analysis for Crystals and the Use of International Tables
• Solved Problems.