Acoustic Scanning Probe Microscopy

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Marinello, Francesco (Επιμελητής έκδοσης), Passeri, Daniele (Επιμελητής έκδοσης), Savio, Enrico (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
• Σειρά: NanoScience and Technology,
• Θέματα: Physics.; Acoustics.; Lasers.; Photonics.; Nanotechnology.; Materials science.; Materials > Surfaces.; Thin films.; Laser Technology, Photonics.; Nanotechnology and Microengineering.; Characterization and Evaluation of Materials.; Surfaces and Interfaces, Thin Films.

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive...

Πίνακας περιεχομένων:

• From the contents: Overview of acoustic techniques
• Contact dynamics modelling
• Cantilever dynamics: theoretical modeling
• Finite elements modelling
• AFAM calibration
• Enhanced sensitivity
• UAFM
• Holography calibration
• UFM
• Friction/lateral techniques
• Harmonix
• Scanning microdeformation microscopy (SMM)
• Tip wear
• Comparison with other techniques
• Applications polymer
• Thin films.