Fault Analysis in Cryptography

• Corporate Author: SpringerLink (Online service)
• Other Authors: Joye, Marc (Editor), Tunstall, Michael (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
• Series: Information Security and Cryptography,
• Subjects: Computer science.; Computer hardware.; Data structures (Computer science).; Electrical engineering.; Computer Science.; Data Structures, Cryptology and Information Theory.; Computer Hardware.; Electrical Engineering.

In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industr...