Transmission Electron Microscopy and Diffractometry of Materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...
Κύριοι συγγραφείς: | , |
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Συγγραφή απο Οργανισμό/Αρχή: | |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2013.
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Έκδοση: | 4th ed. 2013. |
Σειρά: | Graduate Texts in Physics,
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Diffraction and X-Ray Powder Diffractometer Problems
- TEM and its Optics Problems
- Neutron Scattering Problems
- Scattering Problems
- Inelastic Electron Scattering and Spectroscopy Problems
- Diffraction from Crystals Sphere Problems
- Electron Diffraction and Crystallography Problems
- Diffraction Contrast in TEM Images Problems
- Diffraction Lineshapes Problems
- Patterson Functions and Diffuse Scattering Problems
- High-Resolution TEM Imaging Problems
- High-Resolution STEM and Related Imaging Techniques Problems
- Dynamical Theory Problems.