Transmission Electron Microscopy and Diffractometry of Materials

• Κύριοι συγγραφείς: Fultz, Brent (Συγγραφέας), Howe, James (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
• Έκδοση: 4th ed. 2013.
• Σειρά: Graduate Texts in Physics,
• Θέματα: Physics.; Spectroscopy.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Microscopy.; Materials science.; Materials > Surfaces.; Spectroscopy and Microscopy.; Characterization and Evaluation of Materials.; Spectroscopy/Spectrometry.; Surfaces and Interfaces, Thin Films.; Surface and Interface Science, Thin Films.

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...