Ellipsometry at the Nanoscale

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Losurdo, Maria (Επιμελητής έκδοσης), Hingerl, Kurt (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
• Θέματα: Engineering.; Physical measurements.; Measurement.; Nanotechnology.; Materials science.; Nanotechnology and Microengineering.; Measurement Science and Instrumentation.; Characterization and Evaluation of Materials.

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...