Ellipsometry at the Nanoscale

• Corporate Author: SpringerLink (Online service)
• Other Authors: Losurdo, Maria (Editor), Hingerl, Kurt (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
• Subjects: Engineering.; Physical measurements.; Measurement.; Nanotechnology.; Materials science.; Nanotechnology and Microengineering.; Measurement Science and Instrumentation.; Characterization and Evaluation of Materials.

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...