Ellipsometry at the Nanoscale

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Losurdo, Maria (Επιμελητής έκδοσης), Hingerl, Kurt (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
• Θέματα: Engineering.; Physical measurements.; Measurement.; Nanotechnology.; Materials science.; Nanotechnology and Microengineering.; Measurement Science and Instrumentation.; Characterization and Evaluation of Materials.

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...

Πίνακας περιεχομένων:

• Preamble
• Preface
• A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis
• Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations
• Relationship between Surface Morphology and Effective Medium Roughness
• Plasmonics and Effective-Medium Theory
• Thin films of Nanostructured Plasmonic Noble Metals.-  Spectroscopic Ellipsometry on Metallic Gratings
• Mueller matrix applied to nanostructures
• Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles
• Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition
• THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures
• Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates
• Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale
• Polarimetric and other Optical Probes for the Solid - Liquid Interface
• Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices
• Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications
• Ellipsometry of semiconductor nanocrystals
• Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry
• Thin film applications in research and industry characterized by spectroscopic ellipsometry
• Ellipsometry and Correlation Measurements
• Nanotechnology: Applications and markets, present and future.