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03261nam a22005535i 4500 |
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978-3-642-38177-5 |
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DE-He213 |
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20151125221502.0 |
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cr nn 008mamaa |
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130906s2014 gw | s |||| 0|eng d |
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|a 9783642381775
|9 978-3-642-38177-5
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|a 10.1007/978-3-642-38177-5
|2 doi
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|a SCI068000
|2 bisacsh
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|a 530.8
|2 23
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|a Benediktovich, Andrei.
|e author.
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|a Theoretical Concepts of X-Ray Nanoscale Analysis
|h [electronic resource] :
|b Theory and Applications /
|c by Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov.
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2014.
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| 300 |
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|a XIII, 318 p. 108 illus., 37 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a text file
|b PDF
|2 rda
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|a Springer Series in Materials Science,
|x 0933-033X ;
|v 183
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|a Basic principles of the interaction between X-rays and matter -- X-ray reflectivity -- High-resolution X-ray diffraction -- Grazing-incidence small-angle X-ray scattering -- Theory of X-ray scattering from imperfect crystals -- X-ray diffraction for evaluation of residual stresses in polycrystals -- Methods of mathematical and physical optimization of X-ray data analysis.
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| 520 |
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|a This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
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|a Physics.
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| 650 |
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|a Physical measurements.
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| 650 |
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|a Measurement.
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| 650 |
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|a Spectroscopy.
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| 650 |
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|a Microscopy.
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| 650 |
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|a Materials science.
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| 650 |
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4 |
|a Physics.
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| 650 |
2 |
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|a Measurement Science and Instrumentation.
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| 650 |
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|a Characterization and Evaluation of Materials.
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| 650 |
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|a Theoretical, Mathematical and Computational Physics.
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| 650 |
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|a Applied and Technical Physics.
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| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
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| 700 |
1 |
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|a Feranchuk, Ilya.
|e author.
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| 700 |
1 |
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|a Ulyanenkov, Alexander.
|e author.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 776 |
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8 |
|i Printed edition:
|z 9783642381768
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| 830 |
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|a Springer Series in Materials Science,
|x 0933-033X ;
|v 183
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| 856 |
4 |
0 |
|u http://dx.doi.org/10.1007/978-3-642-38177-5
|z Full Text via HEAL-Link
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| 912 |
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|a ZDB-2-PHA
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| 950 |
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|a Physics and Astronomy (Springer-11651)
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