Theoretical Concepts of X-Ray Nanoscale Analysis Theory and Applications /

• Κύριοι συγγραφείς: Benediktovich, Andrei (Συγγραφέας), Feranchuk, Ilya (Συγγραφέας), Ulyanenkov, Alexander (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
• Σειρά: Springer Series in Materials Science, 183
• Θέματα: Physics.; Physical measurements.; Measurement.; Spectroscopy.; Microscopy.; Materials science.; Measurement Science and Instrumentation.; Characterization and Evaluation of Materials.; Theoretical, Mathematical and Computational Physics.; Applied and Technical Physics.; Spectroscopy and Microscopy.

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in d...

Πίνακας περιεχομένων:

• Basic principles of the interaction between X-rays and matter
• X-ray reflectivity
• High-resolution X-ray diffraction
• Grazing-incidence small-angle X-ray scattering
• Theory of X-ray scattering from imperfect crystals
• X-ray diffraction for evaluation of residual stresses in polycrystals
• Methods of mathematical and physical optimization of X-ray data analysis.