Ellipsometry of Functional Organic Surfaces and Films

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Hinrichs, Karsten (Επιμελητής έκδοσης), Eichhorn, Klaus-Jochen (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
• Σειρά: Springer Series in Surface Sciences, 52
• Θέματα: Physics.; Physical chemistry.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Optics.; Optoelectronics.; Plasmons (Physics).; Materials science.; Materials > Surfaces.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Physical Chemistry.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Characterization and Evaluation of Materials.
• Φυσική περιγραφή: XXI, 363 p. 216 illus., 55 illus. in color. online resource.
• ISBN: 9783642401282
• ISSN: 0931-5195 ;

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.