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03297nam a22006135i 4500 |
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978-3-642-40128-2 |
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DE-He213 |
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20151125221305.0 |
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cr nn 008mamaa |
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131024s2014 gw | s |||| 0|eng d |
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|a 9783642401282
|9 978-3-642-40128-2
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|a 10.1007/978-3-642-40128-2
|2 doi
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|d GrThAP
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|a QC176.8.S8
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|a QC611.6.S9
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|a QC176.84.S93
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|a SCI077000
|2 bisacsh
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|a 530.417
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|a Ellipsometry of Functional Organic Surfaces and Films
|h [electronic resource] /
|c edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2014.
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| 300 |
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|a XXI, 363 p. 216 illus., 55 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a text file
|b PDF
|2 rda
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|a Springer Series in Surface Sciences,
|x 0931-5195 ;
|v 52
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| 505 |
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|a Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared brillant light sources for micro-ellipsometric studies of organic films -- Collection of optical constants of organic layers.
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| 520 |
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|a Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
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| 650 |
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|a Physics.
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| 650 |
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|a Physical chemistry.
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| 650 |
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|a Surfaces (Physics).
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| 650 |
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|a Interfaces (Physical sciences).
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| 650 |
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|a Thin films.
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| 650 |
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0 |
|a Optics.
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| 650 |
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|a Optoelectronics.
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| 650 |
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|a Plasmons (Physics).
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| 650 |
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|a Materials science.
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| 650 |
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|a Materials
|x Surfaces.
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| 650 |
1 |
4 |
|a Physics.
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| 650 |
2 |
4 |
|a Surface and Interface Science, Thin Films.
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| 650 |
2 |
4 |
|a Surfaces and Interfaces, Thin Films.
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| 650 |
2 |
4 |
|a Physical Chemistry.
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| 650 |
2 |
4 |
|a Optics, Optoelectronics, Plasmonics and Optical Devices.
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| 650 |
2 |
4 |
|a Characterization and Evaluation of Materials.
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| 700 |
1 |
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|a Hinrichs, Karsten.
|e editor.
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| 700 |
1 |
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|a Eichhorn, Klaus-Jochen.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 776 |
0 |
8 |
|i Printed edition:
|z 9783642401275
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| 830 |
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|a Springer Series in Surface Sciences,
|x 0931-5195 ;
|v 52
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| 856 |
4 |
0 |
|u http://dx.doi.org/10.1007/978-3-642-40128-2
|z Full Text via HEAL-Link
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| 912 |
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|a ZDB-2-CMS
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| 950 |
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|a Chemistry and Materials Science (Springer-11644)
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