In-situ Materials Characterization Across Spatial and Temporal Scales /

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, elect...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Ziegler, Alexander (Επιμελητής έκδοσης), Graafsma, Heinz (Επιμελητής έκδοσης), Zhang, Xiao Feng (Επιμελητής έκδοσης), Frenken, Joost W.M (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Σειρά:Springer Series in Materials Science, 193
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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024 7 |a 10.1007/978-3-642-45152-2  |2 doi 
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050 4 |a T174.7 
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245 1 0 |a In-situ Materials Characterization  |h [electronic resource] :  |b Across Spatial and Temporal Scales /  |c edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken. 
264 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg :  |b Imprint: Springer,  |c 2014. 
300 |a XI, 256 p. 124 illus., 78 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a Springer Series in Materials Science,  |x 0933-033X ;  |v 193 
505 0 |a Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization. 
520 |a The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction. 
650 0 |a Physics. 
650 0 |a Nanoscale science. 
650 0 |a Nanoscience. 
650 0 |a Nanostructures. 
650 0 |a Spectroscopy. 
650 0 |a Microscopy. 
650 0 |a Structural materials. 
650 0 |a Nanotechnology. 
650 0 |a Materials science. 
650 0 |a Materials  |x Surfaces. 
650 0 |a Thin films. 
650 1 4 |a Physics. 
650 2 4 |a Nanoscale Science and Technology. 
650 2 4 |a Characterization and Evaluation of Materials. 
650 2 4 |a Spectroscopy and Microscopy. 
650 2 4 |a Surfaces and Interfaces, Thin Films. 
650 2 4 |a Nanotechnology. 
650 2 4 |a Structural Materials. 
700 1 |a Ziegler, Alexander.  |e editor. 
700 1 |a Graafsma, Heinz.  |e editor. 
700 1 |a Zhang, Xiao Feng.  |e editor. 
700 1 |a Frenken, Joost W.M.  |e editor. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9783642451515 
830 0 |a Springer Series in Materials Science,  |x 0933-033X ;  |v 193 
856 4 0 |u http://dx.doi.org/10.1007/978-3-642-45152-2  |z Full Text via HEAL-Link 
912 |a ZDB-2-PHA 
950 |a Physics and Astronomy (Springer-11651)