In-situ Materials Characterization Across Spatial and Temporal Scales /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Ziegler, Alexander (Editor), Graafsma, Heinz (Editor), Zhang, Xiao Feng (Editor), Frenken, Joost W.M (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
• Series: Springer Series in Materials Science, 193
• Subjects: Physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Spectroscopy.; Microscopy.; Structural materials.; Nanotechnology.; Materials science.; Materials > Surfaces.; Thin films.; Nanoscale Science and Technology.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Surfaces and Interfaces, Thin Films.; Structural Materials.

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, elect...

Table of Contents:

• Scanning Probe Microscopy on 'Live' Catalysts
• In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources
• Advanced in situ transmission electron microscopy
• Ultra-fast TEM and Electron Diffraction
• In-Situ Materials Characterization with FIB/SEM
• In-situ X-ray photoelectron spectroscopy
• “Real-time” probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy
• Time-Resolved Neutron Scattering
• Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.