Chen, Z. (2017). Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods. Springer Fachmedien Wiesbaden : Imprint: Springer Vieweg.
Παραπομπή σε μορφή Chicago (17η εκδ.)Chen, Zhiwen. Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods. Wiesbaden: Springer Fachmedien Wiesbaden : Imprint: Springer Vieweg, 2017.
Παραπομπή σε μορφή MLA (8th εκδ.)Chen, Zhiwen. Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods. Springer Fachmedien Wiesbaden : Imprint: Springer Vieweg, 2017.
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