Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry

• Κύριος συγγραφέας: Heller-Krippendorf, Danica (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Wiesbaden : Springer Fachmedien Wiesbaden : Imprint: Springer Spektrum, 2019.
• Έκδοση: 1st ed. 2019.
• Θέματα: Mass spectrometry.; Physics.; Spectroscopy.; Mass Spectrometry.; Applied and Technical Physics.; Spectroscopy/Spectrometry.

Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-efficient MVA of the respective ToF SIMS data. Priority is given to two main aspects by the author: First, the focus is on strategies for a mo...

Πίνακας περιεχομένων:

• Advantages of Correlation Loadings for MVA of ToF-SIMS Spectra
• Required Number of Replicate Measurements in an Industrial Context
• Selection of Suitable Data Pre-processing in Root Cause Analysis Including the Selection of an Efficient Peak List, Scaling, Normalization and Centering
• New Presentation of PCA Results in Order to Simplify Data Analysis.