Transmission Electron Microscopy Physics of Image Formation and Microanalysis /

• Κύριος συγγραφέας: Reimer, Ludwig (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1997.
• Έκδοση: 4th ed. 1997.
• Σειρά: Springer Series in Optical Sciences, 36
• Θέματα: Physical measurements.; Measurement .; Cell biology.; Measurement Science and Instrumentation.; Cell Biology.

 Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fourth edition includes discussion of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices. 

 1. Introduction -- 2. Particle Optics of Electrons -- 3. Wave Optics of Electrons -- 4. Elements of a Transmission Electron Microscope -- 5. Electron-Specimen Interactions -- 6. Scattering and Phase Contrast for Amorphous Specimens -- 7. Theory of Electron Diffraction -- 8. Electron Diffraction Modes and Applications -- 9. Imaging of Crystalline Specimens and Their Defects -- 10. Elemental Analysis by X-Ray and Electron Energy-Loss Spectroscopy -- 11. Specimen Damage by Electron Irradiation -- References.