Surface Science Tools for Nanomaterials Characterization

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Kumar, Challa S.S.R (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
• Θέματα: Chemistry.; Nanochemistry.; Nanoscale science.; Nanoscience.; Nanostructures.; Nanotechnology.; Nanoscale Science and Technology.

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered an...

Πίνακας περιεχομένων:

• Higher Resolution Scanning Probe Methods for Magnetic Imaging
• The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials
• SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography
• Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy
• Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
• Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
• Magnetic Force Microscopy
• High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films
• FIM-Characterized Tips for SPM
• Scanning Conductive Torsion Mode Microscopy
• Scanning Probe Acceleration Microscopy (SPAM)
• Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures
• Field Ion Microscopy (FIM)
• Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.