The Source/Drain Engineering of Nanoscale Germanium-based MOS Devices
This book mainly focuses on reducing the high parasitic resistance in the source/drain of germanium nMOSFET. With adopting of the Implantation After Germanide (IAG) technique, P and Sb co-implantation technique and Multiple Implantation and Multiple Annealing (MIMA) technique, the electron Schottky...
| Κύριος συγγραφέας: | Li, Zhiqiang (Συγγραφέας) |
|---|---|
| Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
| Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2016.
|
| Σειρά: | Springer Theses, Recognizing Outstanding Ph.D. Research,
|
| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
-
The Physics of Semiconductors An Introduction Including Nanophysics and Applications /
ανά: Grundmann, Marius
Έκδοση: (2016) -
The Thermoballistic Transport Model A Novel Approach to Charge Carrier Transport in Semiconductors /
ανά: Lipperheide, Reinhard, κ.ά.
Έκδοση: (2014) -
Debye Screening Length Effects of Nanostructured Materials /
ανά: Ghatak, Kamakhya Prasad, κ.ά.
Έκδοση: (2014) -
Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering /
Έκδοση: (2015) -
Dispersion Relations in Heavily-Doped Nanostructures
ανά: Ghatak, Kamakhya Prasad
Έκδοση: (2016)